EE
340 - Electronic Devices
Lec
A1 Home Page - Fall
2009
Instructor
Prof.
Stephane Evoy
Room
ECERF W2-114
Phone:
492-5866
Email:
evoy@ece.ualberta.ca
Office
hours: Mon 1-3 p, Tue 9:30-10:30 Wed 1-3 p,
Class
Information
Lectures:
MWF 10:00-10:50, ETLC
2-002 Seminars:
Thu 1:00 - 1:50, NRE 1 001 |
Teaching
Assistant
TBA
|
:
·
Identify
active device circuit elements, their terminals, and connections
·
Outline
and execute procedures for analysing diode,
transistor, and amplifier circuits
·
Explain
the physical operation of the electronic devices studied in this course using
basic (classical) physical electronic concepts and terminology
·
Distinguish
between DC and AC signals and between large- and small-signal analysis regimes
·
Interpret
the current-voltage characteristics of electronic devices
·
Apply
small-signal circuit models to electonic circuits
·
Identify
mode of operation of electronic devices, apply appropriate models and
equations to analyse circuits built on said
devices
·
Calculate
voltages or currents in small-signal circuit analysis
·
Derive
expressions linking voltages/currents and device parameters of
diodes/transistors
·
Evaluate
and optimise the performance of electronic
circuits (both models and lab designs)
·
Design
(in the lab) electronic circuits to meet the design objectives, implement
a prototype of the design, test its operation (measurements),
verify the design using circuit simulation, and evaluate the
design (report)
Microelectronic
Circuits (5th edition)
Authors:
Adel S. Sedra, Kenneth C. Smith, K.C. Smith, Kenneth Carless
Smith
Format:
Hardcover, 1360 pages
Publisher:
Oxford Univ Pr
ISBN-10:
0195142519
ISBN-13:
9780195142518
|
Weeks |
Broad
Topic |
Concepts |
1-2 |
Basics of
diodes |
Diode models,
Breakdown and Zener diodes, circuit applications
of diodes. |
2-3 |
Semiconductor physics
and p-n junctions |
Semiconductors,
electrons and holes, doping of semiconductors, drift and diffusion, the
p-n junction, another look at the diode models |
4-7 |
Bipolar junction
transistors (BJTs) |
Basic structure and
physics, modes of operation, npn and pnp transistors, i-v characteristics, BJT as an amplifier and as a switch, small and large
signal models |
8-10 |
Field effect
transistors (FETs) |
Enhancement- and
depletion-type MOSFETs, basic structure and physics, i-v characteristics, FET as an amplifier and as a switch, digital logic
based on FETs, integrated circuits |
11-12 |
Differential
amplifiers |
FET differential pair,
differential amplifiers with active
loads |
Lecture |
Main
Concepts |
Sections in Sedra and Smith |
1 |
Ideal diodes and
analysis of diode circuits |
3.1 |
2 |
Ideal diodes and the
forward characteristics of real diodes |
3.2 to
3.3 |
3 |
Diode reverse
breakdown characteristics, Zener
diodes |
3.4 |
4 |
Diode rectifier
circuits and application to DC power supplies |
3.5 and
3.9 |
5 |
Basic semiconductor
concepts – electrons and holes, energy gap, electron-hole-pair
generation |
3.7.1 |
6 |
Holes, recombination,
intrinsic carrier concentration |
3.7.1 |
7 |
Conduction in
semiconductors – drift and diffusion |
3.7.1 |
8 |
Doped semiconductors,
the mass-action law |
3.7.1 |
9 |
The open-circuit pn junction |
3.7.2 |
10 |
The reverse-biased
pn junction, depletion capacitance, breakdown in
the pn junction |
3.7.3-3.7.4 |
11 |
The forward-biased
pn junction |
3.7.5 |
12 |
Diode ideality factor,
relationship between bandgap and cut-in voltage,
short diodes, diffusion capacitance, dynamic diode
resistance |
3.7.5,
3.3.8 |
13 |
Linearity and
superposition review, diode small signal model |
3.3.8 |
14 |
Introduction to the
BJT, forward active mode of the BJT |
5.1.1-5.1.2 |
15 |
Forward active mode
current relationships, beta and alpha, large signal models for the forward
active mode |
5.1.2 |
16 |
Reverse active mode,
Ebers-Moll (EM) model,
saturation mode |
5.1.3-5.1.5 |
17 |
BJT circuit symbols,
graphical representations of transistor characteristics, the Early
effect |
5.2.1-5.2.2 |
18 |
Large- and
small-signal common emitter current gain, BJT data sheets, BJT breakdown,
the Early effect in common-emitter
characteristics |
5.2.3-5.2.4 |
19 |
Common-emitter
amplifier, skeleton circuit and basic concepts |
5.3.1-5.3.2 |
20 |
Graphical analysis of
common emitter amplifier, classical biasing arrangmenet for BJT
amplifiers |
5.3.3,
5.5.1 |
21 |
Biasing of BJT amps,
small signal model for BJT |
5.5.2-5.5.4,
5.6 |
22 |
Single-stage BJT
amplifiers |
5.7 |
23 |
Common emitter amp,
common base amp, voltage buffer amps |
5.7, 1.5,
2.3.4 |
24 |
Common collector amp,
summary of BJT amps |
5.7 |
25 |
MOSFET introduction,
n-channel enhancement MOSFET |
4.1.1-4.1.5 |
26 |
MOSFET i-v characteristics and large signal
model |
4.1.6,
4.2.1-2 |
27 |
Channel length
modulation, p-channel enhancement MOSFET, CMOS, MOSFET as an amplifier and
switch |
4.2.3-4, 4.1.7-8, 4.3,
4.4.1-3 |
28 |
MOSFET as an
amplifier, biasing MOSFET amplifier circuits |
4.4.5-6,
4.5 |
29 |
MOSFET small signal
models, single-stage MOSFET amps |
4.6,
4.7.1 |
30 |
Digital
logic inverters, CMOS digital logic inverter |
1.7.1-5,
4.10 |
31 |
Difference amplifiers,
MOS differential pair amp large signal properties |
2.4,
7.1 |
32 |
Small signal analysis
of MOSFET diff pair amp, non-idealities |
7.2 |
Item |
Weight |
Date |
Problem
sets |
10% |
|
Design
lab: |
15% |
|
Examination #1: |
25% |
TBA |
Examination #2: |
25% |
TBA |
Examination #3: |
25% |
TBA |
Total: |
100% |
|
· Problem
sets and their solutions will be distributed by
email
· The
content of the three examinations is *not*
cumulative
· Homework
assignments are expected to be independent work. Plagiarism and/or “carbon
copies”will
not be tolerated, will result in a grade of zero for that HW, and will be reported to School
authorities
·
Lateness
penalty for homework: 30 %
off of score (at
|